Indisponibilité programmée / Scheduled outage
2-7 May 2010
Oustau Calendal Conference Center
Europe/Paris timezone
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Comparison of Candidate Secondary Electron Emission Materials

4 May 2010, 10:15
Oustau Calendal Conference Center

Oustau Calendal Conference Center

Cassis, France
Poster Photon detection for Cherenkov counters Poster Session 1 (Summary)


Prof. Valentin Ivanov (Muons, Inc.)


We have developed a theoretical method for calculating secondary electron emission (SEE) yields. The method uses Monte Carlo simulation, empirical theories, and close comparison to experiment, in order to parameterize the SEE yields of highly emissive materials for microchannel plates. We have successfully applied this method to bulk Al2O3, a highly emissive material as well as to thinly deposited films of Al2O3. The simulation results will be used in the selection of emissive and resistive materials for the deposition and characterization experiments that will be conducted by a large-area fast detector project at Argonne National Laboratory.
Please indicate "poster" or "plenary" session. Final decision will be made by session coordinators. plenary

Primary author

Prof. Valentin Ivanov (Muons, Inc.)


Prof. Henry Frisch (University of Chicago) Dr Zeke Insepov (ANL)

Presentation Materials