Orateur
Prof.
Valentin Ivanov
(Muons, Inc.)
Description
We have developed a theoretical method for calculating secondary electron emission (SEE)
yields. The method uses Monte Carlo simulation, empirical theories, and close comparison to
experiment, in order to parameterize the SEE yields of highly emissive materials for microchannel plates. We have successfully applied this method to bulk Al2O3, a highly emissive material as well as to thinly deposited films of Al2O3. The simulation results will be used in the
selection of emissive and resistive materials for the deposition and characterization experiments
that will be conducted by a large-area fast detector project at Argonne National Laboratory.
| Please indicate "poster" or "plenary" session. Final decision will be made by session coordinators. | plenary |
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Auteur principal
Prof.
Valentin Ivanov
(Muons, Inc.)
Co-auteurs
Prof.
Henry Frisch
(University of Chicago)
Dr
Zeke Insepov
(ANL)
